Interface Structural Study by Diffraction Anomalous Fine Structure(DAFS).
نویسندگان
چکیده
منابع مشابه
Revisit to diffraction anomalous fine structure
The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel-cut monochromator optics with an undulator synchrotron radiat...
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Diffraction Anomalous Fine-Structure (DAFS) combines the sensitivity to long-range-order of diffraction with the short-range-order sensitivity of XAFS. This makes it possible to use a set of DAFS measured intensities to simultaneously refine both longand short-range structural parameters, while maintaining some constraints between them. This method combines a calculation of the structure factor...
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J. Coraux,1,2,* M. G. Proietti,3 V. Favre-Nicolin,1,2 H. Renevier,1,2 and B. Daudin1 1Commissariat l’Energie Atomique, Département de Recherche Fondamentale sur la Matière Condensée, SP2M/NRS, 17 rue des martyrs, 38054 Grenoble Cedex 9, France 2Université Joseph Fourier, BP 53, 38041, Grenoble Cedex 9, France 3Departamento de Física de la Materia Condensada, Instituto de Ciencia de Materiales d...
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ژورنال
عنوان ژورنال: Materia Japan
سال: 1995
ISSN: 1340-2625,1884-5843
DOI: 10.2320/materia.34.872